JPH01163347U - - Google Patents
Info
- Publication number
- JPH01163347U JPH01163347U JP6044688U JP6044688U JPH01163347U JP H01163347 U JPH01163347 U JP H01163347U JP 6044688 U JP6044688 U JP 6044688U JP 6044688 U JP6044688 U JP 6044688U JP H01163347 U JPH01163347 U JP H01163347U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- operation selection
- test operation
- test
- selection signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6044688U JPH01163347U (en]) | 1988-05-07 | 1988-05-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6044688U JPH01163347U (en]) | 1988-05-07 | 1988-05-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01163347U true JPH01163347U (en]) | 1989-11-14 |
Family
ID=31286150
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6044688U Pending JPH01163347U (en]) | 1988-05-07 | 1988-05-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01163347U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008087907A1 (ja) * | 2007-01-16 | 2008-07-24 | Sharp Kabushiki Kaisha | 受光手段を備える半導体装置、該半導体装置の検査方法及び半導体装置検査装置 |
-
1988
- 1988-05-07 JP JP6044688U patent/JPH01163347U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008087907A1 (ja) * | 2007-01-16 | 2008-07-24 | Sharp Kabushiki Kaisha | 受光手段を備える半導体装置、該半導体装置の検査方法及び半導体装置検査装置 |